ASTM E1523-2009 X射线光电子谱测定中电荷控制和电荷参照技术的标准指南
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【英文标准名称】:StandardGuidetoChargeControlandChargeReferencingTechniquesinX-RayPhotoelectronSpectroscopy
【原文标准名称】:X射线光电子谱测定中电荷控制和电荷参照技术的标准指南
【标准号】:ASTME1523-2009
【标准状态】:现行
【国别】:美国
【发布日期】:2009
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.03
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:chargecontrol;chargereferencing;charging;X-rayphotoelectronspectroscopy;Surfaceanalysis--spectrochemicalanalysis;Augerelectronspectroscopy(AES);Biasreferencing;Chargecontrol/referencing;Golddecoration;Goldmetals/alloys;Inertgases;
【摘要】:TheacquisitionofchemicalinformationfromvariationsintheenergypositionofpeaksintheXPSspectrumisofprimaryinterestintheuseofXPSasasurfaceanalyticaltool.Surfacechargingactstoshiftspectralpeaksindependentoftheirchemicalrelationshiptootherelementsonthesamesurface.ThedesiretoeliminatetheinfluenceofsurfacechargingonthepeakpositionsandpeakshapeshasresultedinthedevelopmentofseveralempiricalmethodsdesignedtoassistintheinterpretationoftheXPSpeakpositions,determinesurfacechemistry,andallowcomparisonofspectraofconductingandnon-conductingsystemsofthesameelement.Itisassumedthatthespectrometerisgenerallyworkingproperlyfornon-insulatingspecimens(seePracticeE902).AlthoughhighlyreliablemethodshavenowbeendevelopedtostabilizesurfacepotentialsduringXPSanalysisofmostmaterials(5,6),nosinglemethodhasbeendevelopedtodealwithsurfacecharginginallcircumstances(10,11).Forinsulators,anappropriatechoiceofanycontrolorreferencingsystemwilldependonthenatureofthespecimen,theinstruments,andtheinformationneeded.Theappropriateuseofchargecontrolandreferencingtechniqueswillresultinmoreconsistent,reproducibledata.Researchersarestronglyurgedtoreportboththecontrolandreferencingtechniquesthathavebeenused,thespecificpeaksandbindingenergiesusedasstandards(ifany),andthecriteriaappliedindeterminingoptimumresultssothattheappropriatecomparisonsmaybemade.1.1ThisguideacquaintstheX-rayphotoelectronspectroscopy(XPS)userwiththevariouschargecontrolandchargeshiftreferencingtechniquesthatareandhavebeenusedintheacquisitionandinterpretationofXPSdatafromsurfacesofinsulatingspecimensandprovidesinformationneededforreportingthemethodsusedtocustomersorintheliterature.1.2ThisguideisintendedtoapplytochargecontrolandchargereferencingtechniquesinXPSandisnotnecessarilyapplicabletoelectron-excitedsystems.1.3ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.4Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:A42
【国际标准分类号】:71_040_50
【页数】:7P.;A4
【正文语种】:英语
【原文标准名称】:X射线光电子谱测定中电荷控制和电荷参照技术的标准指南
【标准号】:ASTME1523-2009
【标准状态】:现行
【国别】:美国
【发布日期】:2009
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.03
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:chargecontrol;chargereferencing;charging;X-rayphotoelectronspectroscopy;Surfaceanalysis--spectrochemicalanalysis;Augerelectronspectroscopy(AES);Biasreferencing;Chargecontrol/referencing;Golddecoration;Goldmetals/alloys;Inertgases;
【摘要】:TheacquisitionofchemicalinformationfromvariationsintheenergypositionofpeaksintheXPSspectrumisofprimaryinterestintheuseofXPSasasurfaceanalyticaltool.Surfacechargingactstoshiftspectralpeaksindependentoftheirchemicalrelationshiptootherelementsonthesamesurface.ThedesiretoeliminatetheinfluenceofsurfacechargingonthepeakpositionsandpeakshapeshasresultedinthedevelopmentofseveralempiricalmethodsdesignedtoassistintheinterpretationoftheXPSpeakpositions,determinesurfacechemistry,andallowcomparisonofspectraofconductingandnon-conductingsystemsofthesameelement.Itisassumedthatthespectrometerisgenerallyworkingproperlyfornon-insulatingspecimens(seePracticeE902).AlthoughhighlyreliablemethodshavenowbeendevelopedtostabilizesurfacepotentialsduringXPSanalysisofmostmaterials(5,6),nosinglemethodhasbeendevelopedtodealwithsurfacecharginginallcircumstances(10,11).Forinsulators,anappropriatechoiceofanycontrolorreferencingsystemwilldependonthenatureofthespecimen,theinstruments,andtheinformationneeded.Theappropriateuseofchargecontrolandreferencingtechniqueswillresultinmoreconsistent,reproducibledata.Researchersarestronglyurgedtoreportboththecontrolandreferencingtechniquesthathavebeenused,thespecificpeaksandbindingenergiesusedasstandards(ifany),andthecriteriaappliedindeterminingoptimumresultssothattheappropriatecomparisonsmaybemade.1.1ThisguideacquaintstheX-rayphotoelectronspectroscopy(XPS)userwiththevariouschargecontrolandchargeshiftreferencingtechniquesthatareandhavebeenusedintheacquisitionandinterpretationofXPSdatafromsurfacesofinsulatingspecimensandprovidesinformationneededforreportingthemethodsusedtocustomersorintheliterature.1.2ThisguideisintendedtoapplytochargecontrolandchargereferencingtechniquesinXPSandisnotnecessarilyapplicabletoelectron-excitedsystems.1.3ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.4Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:A42
【国际标准分类号】:71_040_50
【页数】:7P.;A4
【正文语种】:英语
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